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Topic
DuraMAT December 2024 Webinar
Date & Time

Selected Sessions:

Dec 16, 2024 01:00 PM

Description
"Sequential Stress Testing Identifies Processing Defects in Bifacial Photovoltaic Modules That Limit Durability" Presented by Dana Kern, NREL We use sequential stress testing to investigate hurdles to bifacial silicon photovoltaic (PV) module durability. We highlight case studies of different failure modes that can be identified under sequential stress, including those stemming from lamination defects or poor cell passivation.